Advances in Imaging and Electron Physics

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ISBN: 9780323988636
Published: 2022
Publisher: Academic Press
Language: English
Format: Hardback
Format: 9×6

Description

<i>Advances in Imaging and Electron Physics, Volume 224</i> highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

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