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- Quantitative Atomic-Resolution Electron Microscopy
Quantitative Atomic-Resolution Electron Microscopy
ISBN: 9780128246078
Leidimo metai: 2021
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Leidimo metai: 2021
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Aprašymas
<i>Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the</i> latest release in the <i>Advances in Imaging and Electron Physics</i> series merges two long-running serials, <i>Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The</i> series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
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