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- Nanolithography and Surface Microscopy with Electron Beams
Nanolithography and Surface Microscopy with Electron Beams
ISBN: 9780443314629
Leidimo metai: 2024
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Leidimo metai: 2024
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Aprašymas
<i>Nanolithography and Surface Microscopy with Electron Beams, Volume 231 </i>merges two long-running serials<i>, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy</i>. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.
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